SP3 - Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices
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Tipus de documentText en actes de congrés
Data publicació2022-05
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Reconeixement-NoComercial-SenseObraDerivada 4.0 Internacional
Abstract
Studying the radiation effects on electronic devices is
essential for avionics and space systems. The shrinking technology
nodes and increasing density of devices enhance the sensitivity
of electronic systems to ionizing radiation. Due to their crucial
role, memories and processors are the highest contributors to soft
errors in systems, making them the best candidates for studying
these effects. This work introduces the radiation environment in
space and atmosphere and the main effects that the different
types of ionizing particles that are present in these environments
may produce on electronic devices. Furthermore, mainly focusing
on Single-Event Effects (SEEs), it presents approaches and
tools for modeling SEEs and their impact on memories and
microprocessors. Additionally, experimental results targeting a
Commercial-Off-The-Shelf self-refresh Dynamic RAM are presented.
These experiments are based on radiation test campaigns
in particle accelerators with neutrons and protons. Finally, an
overview of issues and mitigation techniques for microprocessors
is exposed.
CitacióMatana Luza, L. [et al.]. SP3 - Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices. A: 27th IEEE European Test Symposium (ETS). 2022,
Versió de l'editorhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
Fitxers | Descripció | Mida | Format | Visualitza |
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SP3-1.pdf | 3,070Mb | Accés restringit |