S1 - X-Masking for In-System Deterministic Test
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hdl:2117/372136
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Data publicació2022-05
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Abstract
In-system deterministic tests are used in safetysensitive
designs to assure high test coverage, short test time,
and low data volume, typically through an input-streaming-only
approach that allows a quick test delivery. The output side of
the same scheme is, however, inherently vulnerable to unknown
(X) states whose sources vary from uninitialized memory elements
to the last-minute timing violations. Typically, X values
degrade test results and thus test response compaction requires
some form of protection. This paper presents two X-masking
schemes that complement the primary (or level-A) blocking of
unknown values by filtering out those X states that escape the
first stage of masking and shall not reach a test response compactor
or test result sticky-bits deployed by the on-chip compare
framework. Experimental results obtained for eleven industrial
designs show feasibility and efficiency of the proposed schemes
altogether with actual impact of X-masking on various test-related
statistics.
CitacióMrugalski, G. [et al.]. S1 - X-Masking for In-System Deterministic Test. A: 27th IEEE European Test Symposium (ETS). 2022,
Versió de l'editorhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
Fitxers | Descripció | Mida | Format | Visualitza |
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S1-1.pdf | 1,864Mb | Accés restringit |