POS2 - Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries
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Inclou dades d'ús des de 2022
Cita com:
hdl:2117/372132
Tipus de documentText en actes de congrés
Data publicació2022-05
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Reconeixement-NoComercial-SenseObraDerivada 4.0 Internacional
Abstract
In-field test of integrated circuits using Self-Test
Libraries (STLs) is a widely used technique specifically suited to
guarantee the processor’s correct behavior during the operative
lifetime, as mandated by functional safety standards such as
ISO26262. Developing STLs for stuck-at faults requires significant
manual efforts from test engineers, and targeting delay
faults is even more challenging. In order to support this process,
in this paper we propose a method to automate the creation of
STLs targeting delay faults starting from existing STLs targeting
stuck-at faults. The method is based first on identifying excited
but not-observed transition delay faults and then adding suitable
instructions able to detect them. Experimental results on a RISCV
processor show that the method can systematically detect
a significant percentage of the target faults with reasonable
computational effort and test code size increase.
CitacióCantoro, R. [et al.]. POS2 - Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. A: 27th IEEE European Test Symposium (ETS). 2022,
Versió de l'editorhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
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PS2-9.pdf | 411,9Kb | Accés restringit |