dc.contributor.author | Thouabtia, Mohamed |
dc.contributor.author | Oleszczuk, Alexander |
dc.contributor.author | Girg, Thomas |
dc.contributor.author | Allinger, Martin |
dc.date.accessioned | 2022-07-08T08:16:00Z |
dc.date.available | 2022-09-01T07:56:37Z |
dc.date.issued | 2022-05 |
dc.identifier.citation | Thouabtia, M. [et al.]. POS2 - Novel Method to Measure Common Mode Transient Immunity of Isolators. A: 27th IEEE European Test Symposium (ETS). 2022, |
dc.identifier.uri | http://hdl.handle.net/2117/372126 |
dc.description.abstract | Common Mode Transient Immunity (CMTI) is one
of the most important key parameters of an isolator. CMTI
describes the ability of an isolation barrier to withstand fast
common mode transients applied between two isolated circuits
and thus to maintain the system integrity. To measure the
CMTI, very fast voltage changes between the two isolated circuit
grounds must be generated. This paper presents a novel method
to generate the transients and measure the CMTI. A DC-DC
converter is used with a high voltage switch in addition to
an appropriate regulation circuit using only passive elements
to generate the desired voltage level and slope. The method
was implemented on an evaluation board to evaluate a few
commercial digital isolators. Measurement results are presented
and discussed. |
dc.format.extent | 2 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
dc.subject.lcsh | Microelectronics |
dc.subject.lcsh | Integrated circuits |
dc.subject.lcsh | Spintronics |
dc.subject.other | Common Mode Transient Immunity |
dc.subject.other | CMTI testing |
dc.subject.other | Isolator testing |
dc.subject.other | Digital isolator |
dc.subject.other | DC-DC converter |
dc.title | POS2 - Novel Method to Measure Common Mode Transient Immunity of Isolators |
dc.type | Conference report |
dc.subject.lemac | Microelectrònica |
dc.subject.lemac | Circuits integrats |
dc.subject.lemac | Espintrònica |
dc.relation.publisherversion | https://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding |
dc.rights.access | Restricted access - publisher's policy |
local.citation.contributor | 27th IEEE European Test Symposium (ETS) |