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dc.contributor.authorThouabtia, Mohamed
dc.contributor.authorOleszczuk, Alexander
dc.contributor.authorGirg, Thomas
dc.contributor.authorAllinger, Martin
dc.date.accessioned2022-07-08T08:16:00Z
dc.date.available2022-09-01T07:56:37Z
dc.date.issued2022-05
dc.identifier.citationThouabtia, M. [et al.]. POS2 - Novel Method to Measure Common Mode Transient Immunity of Isolators. A: 27th IEEE European Test Symposium (ETS). 2022,
dc.identifier.urihttp://hdl.handle.net/2117/372126
dc.description.abstractCommon Mode Transient Immunity (CMTI) is one of the most important key parameters of an isolator. CMTI describes the ability of an isolation barrier to withstand fast common mode transients applied between two isolated circuits and thus to maintain the system integrity. To measure the CMTI, very fast voltage changes between the two isolated circuit grounds must be generated. This paper presents a novel method to generate the transients and measure the CMTI. A DC-DC converter is used with a high voltage switch in addition to an appropriate regulation circuit using only passive elements to generate the desired voltage level and slope. The method was implemented on an evaluation board to evaluate a few commercial digital isolators. Measurement results are presented and discussed.
dc.format.extent2 p.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject.lcshMicroelectronics
dc.subject.lcshIntegrated circuits
dc.subject.lcshSpintronics
dc.subject.otherCommon Mode Transient Immunity
dc.subject.otherCMTI testing
dc.subject.otherIsolator testing
dc.subject.otherDigital isolator
dc.subject.otherDC-DC converter
dc.titlePOS2 - Novel Method to Measure Common Mode Transient Immunity of Isolators
dc.typeConference report
dc.subject.lemacMicroelectrònica
dc.subject.lemacCircuits integrats
dc.subject.lemacEspintrònica
dc.relation.publisherversionhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
dc.rights.accessRestricted access - publisher's policy
local.citation.contributor27th IEEE European Test Symposium (ETS)


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