ICS2 - Industry Case-Study Presentations Session 2
View/Open
Cita com:
hdl:2117/370000
Document typeConference report
Defense date2022-05
Rights accessOpen Access
Except where otherwise noted, content on this work
is licensed under a Creative Commons license
:
Attribution-NonCommercial-NoDerivs 4.0 International
Abstract
Evaluating Burn-In related Metrics for large Automotive Systems-on-Chip.
Francesco ANGIONE1, Paolo BERNARDI1, Andrea CALABRESE1, Stefano QUER1,
Davide APELLO2, Vincenzo TANCORRE2, Roberto UGIOLI2
1Politecnico di Torino, Italy, 2STMicroelectronics, Italy MBSA Approaches Applied to Next Decade Digital Components.
Tiziano FIORUCCI1, Jean-Marc DAVEAU1, Emmanuel ARBARETIER2, GIORGIO DI
NATALE3, Thomas JACQUET2
1STMicroelectronics, Crolles, Frances, 2APSYS-AIRBUS, France, 3Univ. Grenoble
Alpes/CNRS/TIMA, France Monitoring and controlling handler temperature.
Guy DECABOOTER
Onsemi, Belgium
CitationDobbelaere, W.; Appello, D. Industry Case-Study Presentations Session 2. A: 27th IEEE European Test Symposium (ETS). 2022,