dc.contributor.author | Inglese, Pietro |
dc.contributor.author | Vatajelu, Elena Ioana |
dc.contributor.author | Natale, Giorgio Di |
dc.date.accessioned | 2022-07-12T09:27:29Z |
dc.date.issued | 2022-05 |
dc.identifier.citation | Inglese, P.; Vatajelu, E.I.; Natale, G.D. Analysis and Simulation of Logic-In-Memory Operations. A: 27th IEEE European Test Symposium (ETS). 2022, |
dc.identifier.uri | http://hdl.handle.net/2117/369992 |
dc.description.abstract | The technology evolution has tried to address the
demand for faster computers. Despite the achieved speed-up in
terms of memory and computation performances, the
communication between the memories and the processor remains a
bottleneck. The Computation in-Memory (CIM) aims to solve this
problem by moving the computation directly inside the memory. This
study focuses on the Logic-In-Memory (LIM), which represents the
applications that accelerate Boolean Logic. This paper introduces
the analysis of selected Logic-In-Memory operations simulated
under various operating conditions. This is the preliminary step to
study the behavior of LIM for security applications. |
dc.format.extent | 2 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
dc.subject.lcsh | Microelectronics |
dc.subject.lcsh | Integrated circuits |
dc.subject.lcsh | Spinitronics |
dc.subject.other | Emerging technologies |
dc.subject.other | Logic-In-Memory |
dc.subject.other | Memristors |
dc.subject.other | Non-Volatile memories |
dc.title | PFS - Analysis and Simulation of Logic-In-Memory Operations |
dc.type | Conference report |
dc.subject.lemac | Microelectrònica |
dc.subject.lemac | Circuits integrats |
dc.subject.lemac | Espintrònica |
dc.relation.publisherversion | https://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding |
dc.rights.access | Restricted access - publisher's policy |
dc.date.lift | 10000-01-01 |
local.citation.contributor | 27th IEEE European Test Symposium (ETS) |