PFS - New Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity of Complex SoCs
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Document typeConference report
Defense date2022-05
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Abstract
It is well known that during device testing, the
switching activity (SWA) of the circuit under test (CUT) is
an important parameter that must be retained to a minimal
value in order to avoid unwanted scenarios on the CUTs (e.g.,
over-stressing) that can lead to an artificial yield loss. However,
there are scenarios, e.g., during Burn-In testing (BI), where
the maximization of the SWA can be proven beneficial by
accelerating the aging phenomena of the devices in a safer and
better controlled manner. In the frame of my PhD activities, I
look for new methods able to automatically generate programs
able to maximize the switching activity in a SoC and/or in
the single modules within it. I already developed two methods
while considering microprocessors as case studies, that automate
the generation of stress-inducing stimuli for various units of
a pipelined CPU. The first method is based on evolutionary
techniques, while the second is based on formal techniques. The
microprocessor we considered is the OpenRISC 1200 (OR1200).
CitationDeligiannis, N.I. New Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity of Complex SoCs. A: 27th IEEE European Test Symposium (ETS). 2022,
Publisher versionhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
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