PFS - Strategies and Evaluation Methods to reach Ultra-Reliability in Automotive Systems-on-Chip
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Tipus de documentText en actes de congrés
Data publicació2022-05
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Abstract
Embedded nano-electronic systems are becoming
more prevalent in people’s daily lives. As a result, chip and
embedded system manufacturing has become increasingly complicated
and huge in recent years. Therefore, anomalous system
behaviors also continue to be more increasingly present.
Thinking about safety-critical sectors, such as automotive,
aerospace, or medical, it is evident how managing system anomalies
and defects become vital; in fact, an overlooked defect could
lead to dangerous scenarios for human lives. Therefore, there
must be a set of rigorous control techniques in all phases prior to
the commercialization of a system (testing techniques). Moreover,
impressive processing capabilities are integrated on a single chip
in today’s environment. As a result, manufacturers are faced with
significant complexity in testing their embedded systems. They
became so huge in terms of the number of transistors composing
them and complex that the old methods and techniques cannot
manage and test them anymore, especially in terms of time.
For this reason, it is necessary to develop and investigate
innovative methodologies that can guarantee high reliability
despite the complexity of modern Systems-on-Chip in safety
critical fields.
CitacióIaria, G. Strategies and Evaluation Methods to reach Ultra-Reliability in Automotive Systems-on-Chip. A: 27th IEEE European Test Symposium (ETS). 2022,
Versió de l'editorhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
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