Characterization of time domain EM field double-loaded curved loop probe
Document typeConference report
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessOpen Access
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In this paper, we present and analyze the performance of a double-loaded curved loop probe to measure simultaneously electric and magnetic fields (EMF). The aim is to construct a probe that can be fitted to non-planar structures and have a proper response to EMF. The curved probe is studied in comparison with well-known planar probes, which have been verified and used previously. The time-domain data obtained through EM simulation allow us to identify if the probe's response is suitable although its geometry. Finally, the probe has been constructed and evaluated with experimental test, measuring and validating the conclusions find out by the EM simulation.
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CitationPous, M. [et al.]. Characterization of time domain EM field double-loaded curved loop probe. A: IEEE Global Electromagnetic Compatibility Conference. "2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON): Stellenbosch, South Africa: November 7-9, 2018: proceedings". Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 1-5. ISBN 978-1-5386-5728-7. DOI 10.1109/GEMCCON.2018.8628570.