Characterization of time domain EM field double-loaded curved loop probe

Pous Solà, Marc; Quílez Figuerola, Marcos; Fernández Chimeno, Mireya; Silva Martínez, Fernando

doi:10.1109/GEMCCON.2018.8628570

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Pous Solà, Marc

Quílez Figuerola, Marcos

Fernández Chimeno, Mireya

Silva Martínez, Fernando

Document typeConference report

Defense date2018

PublisherInstitute of Electrical and Electronics Engineers (IEEE)

Rights accessOpen Access

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder

Abstract

In this paper, we present and analyze the performance of a double-loaded curved loop probe to measure simultaneously electric and magnetic fields (EMF). The aim is to construct a probe that can be fitted to non-planar structures and have a proper response to EMF. The curved probe is studied in comparison with well-known planar probes, which have been verified and used previously. The time-domain data obtained through EM simulation allow us to identify if the probe's response is suitable although its geometry. Finally, the probe has been constructed and evaluated with experimental test, measuring and validating the conclusions find out by the EM simulation.

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© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works

CitationPous, M. [et al.]. Characterization of time domain EM field double-loaded curved loop probe. A: IEEE Global Electromagnetic Compatibility Conference. "2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON): Stellenbosch, South Africa: November 7-9, 2018: proceedings". Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 1-5. ISBN 978-1-5386-5728-7. DOI 10.1109/GEMCCON.2018.8628570.

URIhttp://hdl.handle.net/2117/366175

DOI10.1109/GEMCCON.2018.8628570

ISBN978-1-5386-5728-7

Publisher versionhttps://ieeexplore.ieee.org/document/8628570

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