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Optimal tuning of fractional order controllers for dual active bridge-based DC microgrid including voltage stability assessment

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hdl:2117/361220

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Azab, Mohamed
Serrano Fontova, AlexandreMés informació
Document typeArticle
Defense date2021-05-01
Rights accessOpen Access
Attribution-NonCommercial-NoDerivs 4.0 International
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 4.0 International
Abstract
In this article, three evolutionary search algorithms: particle swarm optimization (PSO), simulated annealing (SA) and genetic algorithms (GA), have been employed to determine the optimal parameter values of the fractional-order (FO)-PI controllers implemented in the dual active bridge-based (DAB) DC microgrid. The optimum strategy to obtain the parameters of these FO-PI controllers is still a major challenge for many power systems applications. The FO-PI controllers implemented in the DAB are used to control the DC link voltage to the desired value and limit the current flowing through the converter. Accordingly, the investigated control system has six parameters to be tuned simultaneously; Kp1, Ki1, ¿1 for FO-PI voltage controller and Kp2, Ki2, ¿2 for FO-PI current controller. Crucially, this tuning optimization process has been developed to enhance the voltage stability of a DC microgrid. By observing the frequency-domain analysis of the closed-loop and the results of the subsequent time-domain simulations, it has been demonstrated that the evolutionary algorithms have provided optimal controller gains, which ensures the voltage stability of the DC microgrid. The main contribution of the article can be considered in the successful application of evolutionary search algorithms to tune the parameters of FO-based dual loop controllers of a DC microgrid scheme whose power conditioner is a DAB topology.
CitationAzab, M.; Serrano, A. Optimal tuning of fractional order controllers for dual active bridge-based DC microgrid including voltage stability assessment. "Electronics (Switzerland)", 1 Maig 2021, vol. 10, núm. 9, p. 1109:1-1109:36. 
URIhttp://hdl.handle.net/2117/361220
DOI10.3390/electronics10091109
ISSN2079-9292
Publisher versionhttps://www.mdpi.com/2079-9292/10/9/1109
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