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dc.contributor.authorFont Martínez, Francesc
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Mecànica de Fluids
dc.date.accessioned2021-12-02T12:38:46Z
dc.date.available2021-12-02T12:38:46Z
dc.date.issued2015-07-03
dc.identifier.citationFont, F. Stress effects of silica particles in a semiconductor package molding compound. 2015.
dc.identifier.otherhttps://eprints.lancs.ac.uk/id/eprint/78954/1/Analog15.pdf
dc.identifier.urihttp://hdl.handle.net/2117/357673
dc.description.abstractThe stresses induced on a silicon chip encased in an epoxy compound are considered due to absorption of moisture and the presence of silica particles in the coating. A range of different approaches are considered including a one-dimensional model for the curvature due to the absorption of water in a bi-lateral sheet, numerical simulations for the stress at the molding compound-silicon die interface and a two-dimensional model in the complex plane.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Matemàtiques i estadística
dc.titleStress effects of silica particles in a semiconductor package molding compound
dc.typeExternal research report
dc.contributor.groupUniversitat Politècnica de Catalunya. GReCEF- Grup de Recerca en Ciència i Enginyeria de Fluids
dc.rights.accessOpen Access
local.identifier.drac32208882
dc.description.versionPreprint
local.citation.authorFont, F.


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