Stress effects of silica particles in a semiconductor package molding compound
Document typeResearch report
Rights accessOpen Access
The stresses induced on a silicon chip encased in an epoxy compound are considered due to absorption of moisture and the presence of silica particles in the coating. A range of different approaches are considered including a one-dimensional model for the curvature due to the absorption of water in a bi-lateral sheet, numerical simulations for the stress at the molding compound-silicon die interface and a two-dimensional model in the complex plane.
CitationFont, F. Stress effects of silica particles in a semiconductor package molding compound. 2015.