SRAM arrays with built-in parity computation for real-time error detection in cache tag arrays
Cita com:
hdl:2117/352959
Document typeConference report
Defense date2021
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessOpen Access
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Abstract
This work proposes an SRAM array with built-in real-time error detection (RTD) capabilities. Each cell in the new RTD-SRAM array computes its part of the real-time parity of an SRAM array column on-the-fly. RTD based arrays detect a fault right away after it occurs, rather than when it is read. RTD, therefore, breaks the serialization between data access and error detection and, thus, it can speed-up the access-time of arrays that use on-the-fly error detection and correction. The paper presents an analysis and optimization of an RTD-SRAM and its application to a tag array. Compared to a state-of-the-art tag array protection, the evaluated scheme has comparable error detection and correction strength and, depending on the array dimensions, the access time is reduced by 5% to 18%, energy by 20% to 40% and area up to 30%.
CitationCanal, R.; Sazeides, Y.; Bramnik, A. SRAM arrays with built-in parity computation for real-time error detection in cache tag arrays. A: Design, Automation and Test in Europe Conference and Exhibition. "Proceedings of the 2021 Design, Automation & Test in Europe (DATE 2021): 01-05 February 2021, virtual conference". Institute of Electrical and Electronics Engineers (IEEE), 2021, p. 711-716. ISBN 978-3-9819263-5-4. DOI 10.23919/DATE51398.2021.9473986.
ISBN978-3-9819263-5-4
Publisher versionhttps://ieeexplore.ieee.org/document/9473986
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