Mostra el registre d'ítem simple

dc.contributor.authorBermúdez, Carlos
dc.contributor.authorLaguarta Bertran, Ferran
dc.contributor.authorCadevall Artigues, Cristina
dc.contributor.authorMatilla Sánchez, Aitor
dc.contributor.authorIbañez Ayala, Sergi
dc.contributor.authorArtigas Pursals, Roger
dc.contributor.otherUniversitat Politècnica de Catalunya. Centre de Desenvolupament de Sensors, Instrumentació i Sistemes
dc.date.accessioned2021-09-28T06:59:37Z
dc.date.issued2016
dc.identifier.citationBermúdez, C. [et al.]. Novel stent optical inspection system. A: Imaging and Applied Optics. "Applied Industrial Optics: Spectroscopy, Imaging and Metrology: part of Imaging and Applied Optics 2016: 25-28 July 2016, Heidelberg, Germany". Washington: Optical Society of American (OSA), 2016, p. 1-3. ISBN 978-1-943580-15-6. DOI 10.1364/AIO.2016.AITh2B.3.
dc.identifier.isbn978-1-943580-15-6
dc.identifier.urihttp://hdl.handle.net/2117/352354
dc.description.abstractStent quality control is a critical process. Coronary stents have to be inspected 100% so no defective stent is implanted into a human body. Skilled operators currently perform the quality process control visually, and every stent could need tens of minutes to be inspected. In this paper, a novel stent optical inspection system is presented. By the combination of a high numerical aperture microscope, a triple illumination optical system, a rotational stage, and a line-scan camera, unrolled sections of the outer and inner surfaces of the stent are obtained with high resolution at high speed. We expect with this new approach to make the stent inspection task more objective and to dramatically reduce the time and the overall cost of the stent quality control process.
dc.format.extent3 p.
dc.language.isoeng
dc.publisherOptical Society of American (OSA)
dc.subjectÀrees temàtiques de la UPC::Ciències de la salut
dc.subject.lcshStents (Surgery)
dc.subject.lcshMicroscopy
dc.titleNovel stent optical inspection system
dc.typeConference report
dc.subject.lemacStents
dc.subject.lemacMicroscòpia
dc.contributor.groupUniversitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica
dc.identifier.doi10.1364/AIO.2016.AITh2B.3
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://www.osapublishing.org/abstract.cfm?uri=AIO-2016-AITh2B.3
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac31893753
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorBermúdez, C.; Laguarta, F.; Cadevall, C.; Matilla, A.; Ibañez, S.; Artigas, R.
local.citation.contributorImaging and Applied Optics
local.citation.pubplaceWashington
local.citation.publicationNameApplied Industrial Optics: Spectroscopy, Imaging and Metrology: part of Imaging and Applied Optics 2016: 25-28 July 2016, Heidelberg, Germany
local.citation.startingPage1
local.citation.endingPage3


Fitxers d'aquest items

Imatge en miniatura

Aquest ítem apareix a les col·leccions següents

Mostra el registre d'ítem simple