Security, reliability and test aspects of the RISC-V ecosystem
Tipus de documentComunicació de congrés
Data publicació2021-05
EditorInstitute of Electrical and Electronics Engineers (IEEE)
Condicions d'accésAccés obert
Tots els drets reservats. Aquesta obra està protegida pels drets de propietat intel·lectual i
industrial corresponents. Sense perjudici de les exempcions legals existents, queda prohibida la seva
reproducció, distribució, comunicació pública o transformació sense l'autorització del titular dels drets
ProjecteSELENE - SELENE: Self-monitored Dependable platform for High-Performance Safety-Critical Systems (EC-H2020-871467)
FRACTAL - A Cognitive Fractal and Secure EDGE based on an unique Open-Safe-Reliable-Low Power Hardware Platform Node (EC-H2020-877056)
FRACTAL - A Cognitive Fractal and Secure EDGE based on an unique Open-Safe-Reliable-Low Power Hardware Platform Node (EC-H2020-877056)
Abstract
RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISCV ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISCV, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.
CitacióAbella Ferrer, J. [et al.]. Security, reliability and test aspects of the RISC-V ecosystem. A: IEEE European Test Symposium. "26th IEEE European Test Symposium". [Piscataway, NJ]: Institute of Electrical and Electronics Engineers (IEEE), 2021, p. 1-10. ISBN 978-1-6654-1849-2.
ISBN978-1-6654-1849-2
Versió de l'editorhttps://ieeexplore.ieee.org/document/9465449
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