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dc.contributor.authorRoyo Royo, Santiago
dc.contributor.authorArasa, Josep
dc.contributor.authorCaum Aregay, Jesús
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Òptica i Optometria
dc.date.accessioned2021-06-17T09:43:19Z
dc.date.issued2000
dc.identifier.citationRoyo, S.; Arasa, J.; Caum, J. Submicrometric profilometry of nonrotationally symmetrical surfaces using the Ronchi test. A: International Symposium on Optical Science and Technology. "Laser interferometry X: techniques and analysis [International Conferences on Laser Interferometry X, held as part of SPIE's International Symposium on Optical Science and Technology 2000], 31 July-1 August 2000, San Diego, USA". Washington: International Society for Photo-Optical Instrumentation Engineers (SPIE), 2000, p. 156-164. ISBN 9780819437464. DOI 10.1117/12.498438.
dc.identifier.isbn9780819437464
dc.identifier.urihttp://hdl.handle.net/2117/347442
dc.description.abstractThe Ronchi test is a widely used tool in the optical shop, because of its capability of measuring wide-field profiles of optical quality surfaces through its important ray slope dynamic range. Although many applications have been reported (intraocular lenses, capillary flow measurements, etc.), they are usually limited to obtaining profiles of rotationally symmetrical surfaces, either spherical or aspherical. An easy to set-up Ronchi test technique based in geometrical optics principles has been developed at the CD6, which allows accurate and repetitive wavefront measurements of the topography of both rotationally and non-rotationally symmetrical optical quality surfaces. In order to demonstrate its capabilities, the technique has been applied to the profilometry of the toroidal concave surfaces present in common astigmatic spectacle lenses. Profiles of two sample surfaces at two different distances from the ruling to the sample have been measured with micrometric resolution. As toroidal surfaces are not rotationally symmetrical, both samples have been positioned with its principal meridians following different orientations, in order to demonstrate that the technique performs adequately not only for a range of distances from the ruling to the sample but also regardless how the sample has been oriented. The accuracy of the measurements is demonstrated through the comparison of the radius of curvature values obtained using the proposed Ronchi test technique, with reference radius of curvature values obtained using a high precision radioscope. The technique is shown to measure sub-micrometric surface features on toroidal surfaces by use of a combination of self-developed and commercial software, allowing the observation of surface profile details with extensions of just some tenths of nanometers in depth.
dc.format.extent9 p.
dc.language.isoeng
dc.publisherInternational Society for Photo-Optical Instrumentation Engineers (SPIE)
dc.subjectÀrees temàtiques de la UPC::Ciències de la visió
dc.subject.lcshInterferometry
dc.subject.lcshOptical instruments
dc.titleSubmicrometric profilometry of nonrotationally symmetrical surfaces using the Ronchi test
dc.typeConference report
dc.subject.lemacInterferometria
dc.subject.lemacÒptica -- Aparells i instruments
dc.contributor.groupUniversitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica
dc.identifier.doi10.1117/12.498438
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/4101/0000/Submicrometric-profilometry-of-nonrotationally-symmetrical-surfaces-using-the-Ronchi-test/10.1117/12.498438.short?webSyncID=57c79222-0931-5269-e60e-2761407428a3&sessionGUID=8ac17abd-736d-8020-bb51-029b6aa297d6&_ga=2.65301928.748720339.1586874088-1139712329.1585921431
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac27750121
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorRoyo, S.; Arasa, J.; Caum, J.
local.citation.contributorInternational Symposium on Optical Science and Technology
local.citation.pubplaceWashington
local.citation.publicationNameLaser interferometry X: techniques and analysis [International Conferences on Laser Interferometry X, held as part of SPIE's International Symposium on Optical Science and Technology 2000], 31 July-1 August 2000, San Diego, USA
local.citation.startingPage156
local.citation.endingPage164


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