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dc.contributor.authorSaura Perisé, Jaime
dc.contributor.authorBakkar, Mostafa
dc.contributor.authorBogarra Rodríguez, Santiago
dc.contributor.otherUniversitat Politècnica de Catalunya. Doctorat en Enginyeria Elèctrica
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica
dc.date.accessioned2020-10-13T15:02:24Z
dc.date.available2020-10-13T15:02:24Z
dc.date.issued2020-02-27
dc.identifier.citationSaura, J.; Bakkar, M.; Bogarra, S. Open-circuit fault diagnosis and maintenance in multi-pulse parallel and series TRU topologies. "IEEE transactions on power electronics", 27 Febrer 2020, vol. 35, núm. 10, p. 10906-10916.
dc.identifier.issn0885-8993
dc.identifier.urihttp://hdl.handle.net/2117/330181
dc.description©2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.description.abstractTransformer Rectifier Units (TRUs) are a reliable way for DC generation in several electric applications. These units are formed by multiple three-phase uncontrolled bridge rectifiers connected according to two main topologies (parallel and series), and fed by a phase-shifting transformer, which can have different configurations. Fault diagnosis of the uncontrolled bridge rectifier diodes is one of the most important concerns on the electronic devices, nonetheless, rectifier units are inherently not protected in front of Open-Circuit (O/C) faults, which cause malfunction and performance deterioration. In order to solve this drawback, the proposed fault diagnosis method is based on the O/C fault signature observed in the DC-link output voltage of TRUs rectifier. It allows detecting the O/C diodes of parallel and series TRUs with different phase-shifting transformer configurations and for the most usual fault scenarios. Moreover, it also helps the prediction of diodes that could be exposed to failure after the fault, which provides corrective maintenance for the TRU development. The proposed method is illustrated from MATLABTM numerical simulations of a 12-pulse TRU, and is validated with experimental tests.
dc.description.sponsorshipThis work supported in part by the Research Project Estabilidad de Redes MVdc Integrando Tecnologias de Energias Renovables, Almacenamiento de Energia y Convertidores de Fuente de Impedancia, RTI2018-095720-B-C33, in part by the Ministerio de Ciencia, Innovación y Universidades, and in part by the European Union.
dc.format.extent11 p.
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectric currents
dc.subject.lcshElectric current rectifiers
dc.subject.otherCondition monitoring
dc.subject.otherFault diagnosis
dc.subject.otherOpencircuit (O/C) faults
dc.subject.otherThree-phase uncontrolled bridge rectifier
dc.subject.otherTransformer rectifier unit (TRU)
dc.titleOpen-circuit fault diagnosis and maintenance in multi-pulse parallel and series TRU topologies
dc.typeArticle
dc.subject.lemacCorrents elèctrics
dc.subject.lemacRectificadors de corrent elèctric
dc.contributor.groupUniversitat Politècnica de Catalunya. QSE - Qualitat del Subministrament Elèctric
dc.identifier.doi10.1109/TPEL.2020.2976895
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://ieeexplore.ieee.org/abstract/document/9016138
dc.rights.accessOpen Access
local.identifier.drac28440555
dc.description.versionPostprint (author's final draft)
dc.relation.projectidinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/RTI2018-095720-B-C33/ES/ESTABILIDAD DE REDES MVDC INTEGRANDO TECNOLOGIAS DE ENERGIAS RENOVABLES, ALMACENAMIENTO DE ENERGIA Y CONVERTIDORES DE FUENTE DE IMPEDANCIA/
local.citation.authorSaura, J.; Bakkar, M.; Bogarra, S.
local.citation.publicationNameIEEE transactions on power electronics
local.citation.volume35
local.citation.number10
local.citation.startingPage10906
local.citation.endingPage10916


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