Modeling technique of the conducted emission of integrated circuit under different temperatures

Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio

doi:10.1002/jnm.2076

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Berbel Artal, Néstor

Fernández García, Raúl

Gil Galí, Ignacio

Document typeArticle

Defense date2015

Rights accessOpen Access

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder

Abstract

In this paper the temperature impact on conducted emissions of ICs up to 3 GHz has been analyzed. The electromagnetic conducted emissions of a commercial IC clock generator have been characterized and modelled from 293 K to 358 K. A temperature parametrized lumped-electrical equivalent model including the PCB and IC behaviour has been developed and validated by means of Feature Selective Validation. The results show that the passive distribution network is slightly affected by the temperature, whereas the IC conducted emission presents a clear temperature variation.

CitationBerbel, N.; Fernandez-Garcia, R.; Gil, I. Modeling technique of the conducted emission of integrated circuit under different temperatures. "International journal of numerical modeling. Electronic networks devices and fields", 2015.

URIhttp://hdl.handle.net/2117/28179

DOI10.1002/jnm.2076

ISSN0894-3370

Publisher versionhttp://onlinelibrary.wiley.com/doi/10.1002/jnm.2076/abstract

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