Modeling technique of the conducted emission of integrated circuit under different temperatures

Abstract

In this paper the temperature impact on conducted emissions of ICs up to 3 GHz has been analyzed. The electromagnetic conducted emissions of a commercial IC clock generator have been characterized and modelled from 293 K to 358 K. A temperature parametrized lumped-electrical equivalent model including the PCB and IC behaviour has been developed and validated by means of Feature Selective Validation. The results show that the passive distribution network is slightly affected by the temperature, whereas the IC conducted emission presents a clear temperature variation.