Beam focusing in chirped mirror with a defect

Abstract

Recently the beam focusing in reflection from chirped dielectric mirror has been proposed and demonstrated, where the negative (anomalous) diffraction is responsible for this flat mirror focusing. For a strong focusing performance (large focal distance), a wide angular range of strong (negative) angular dispersion is required. We show that a defect layer in the dielectric mirror (one layer is of a double size), can increase the angular dispersion, and thus improve the focusing performance. By introducing a defect layer in the chirped mirror, the focal distances can be increase from 12 µm up to 22 µm in a specific, calculated, structure, as our numerical integration show.