Statistical Lifetime Analysis in Memristive Crossbar

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Document typeConference report
Defense date2015
Rights accessOpen Access
Abstract
Emerging devices for future memory technologies have attracted great attention recently. Memristors are one of the most favorable such devices, due to their high scalability and compatibility with CMOS fabrication process. Alongside their benefits they also face reliability concerns. In this sense our work
analyzes some sources of uncertainties in the operation of the memristive memory and next proposes an approach to determine
the expected lifetime of a memristive crossbar.
CitationPouyan, P.; Amat, Esteve; Rubio, A. Statistical Lifetime Analysis in Memristive Crossbar. A: Design, Automation and Test in Europe. "DATE Uncertainty Workshop". Grenoble: 2015.
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