Statistical Lifetime Analysis in Memristive Crossbar

Abstract

Emerging devices for future memory technologies have attracted great attention recently. Memristors are one of the most favorable such devices, due to their high scalability and compatibility with CMOS fabrication process. Alongside their benefits they also face reliability concerns. In this sense our work analyzes some sources of uncertainties in the operation of the memristive memory and next proposes an approach to determine the expected lifetime of a memristive crossbar.