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dc.contributor.authorTripathi, Pragya
dc.contributor.authorGonzalo Ruiz, Javier
dc.contributor.authorMitsari, Efstratia
dc.contributor.authorZachariah, Manesh
dc.contributor.authorRomanini, Michela
dc.contributor.authorTamarit Mur, José Luis
dc.contributor.authorMuñoz Berbel, F. Xavier
dc.contributor.authorMacovez, Roberto
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Física i Enginyeria Nuclear
dc.date.accessioned2015-03-02T11:17:38Z
dc.date.created2014-07-29
dc.date.issued2014-07-29
dc.identifier.citationTripathi, P. [et al.]. Silicon-Chip-Based Dielectric Spectroscopy for Conductivity and Molecular Dynamics Studies of Organic Films. "Journal of Physical Chemistry Letters", 29 Juliol 2014, vol. 5, núm. 16, p. 2796-2801.
dc.identifier.issn1948-7185
dc.identifier.urihttp://hdl.handle.net/2117/26553
dc.description.abstractInterdigital electrodes fabricated by standard lithography on silicon chips are employed to probe the dipolar molecular dynamics and electric conduction properties of thin rhodamine films grown with two different methods. The conductivity is due to electronic charge carriers, and at around room-temperature, it is higher by 1 order of magnitude in solution-deposited films than in thermally evaporated ones. The organic material exhibits two intrinsic dynamic processes, of which the one at higher temperature is due to the orientational motion of the dipole moment of the rhodamine units, while the one at lower temperature is due to the motion of a local dipole associated with the chlorine counterions and is absent in thermally evaporated films. Our results show that thin-film dielectric spectroscopy is an easily implementable and versatile tool to extract valuable information on thin organic films.
dc.format.extent6 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Física
dc.subject.lcshSolids
dc.subject.lcshRelaxation
dc.subject.otherInterdigitated electrode arrays
dc.subject.otherhighly stable glasses
dc.subject.otherHopping conductivity
dc.subject.otherThin-films
dc.subject.otherT-G
dc.subject.otherRelaxation
dc.subject.otherSolids
dc.subject.otherOrder
dc.titleSilicon-Chip-Based Dielectric Spectroscopy for Conductivity and Molecular Dynamics Studies of Organic Films
dc.typeArticle
dc.subject.lemacSòlids
dc.subject.lemacRelaxació, Fenòmens de
dc.contributor.groupUniversitat Politècnica de Catalunya. GCM - Grup de Caracterització de Materials
dc.identifier.doi10.1021/jz501119a
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://pubs.acs.org/doi/pdf/10.1021/jz501119a
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac15177912
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorTripathi, P.; Gonzalo, J.; Mitsari, E.; Zachariah, M.; Romanini, M.; Tamarit, J. Ll.; Muñoz-Berbel, X.; Macovez, R.
local.citation.publicationNameJournal of Physical Chemistry Letters
local.citation.volume5
local.citation.number16
local.citation.startingPage2796
local.citation.endingPage2801


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