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Criteria for indirect measurements in M-S testing
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Balado Suárez, Luz María |
dc.contributor.author | Figueras Pàmies, Joan |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2015-02-04T14:53:54Z |
dc.date.created | 2014 |
dc.date.issued | 2014 |
dc.identifier.citation | Álvaro Gómez-Pau; Balado, L.; Figueras, J. Criteria for indirect measurements in M-S testing. A: Workshop on Statistical Test Methods. "Handout of papers: 1st Workshop on statistical test methods: 29-30 May 2014, Paderborn, germany: fringe event to ETS 2014". Paderborn: 2014, p. 1-6. |
dc.identifier.uri | http://hdl.handle.net/2117/26217 |
dc.description.abstract | Analog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog and M-S circuits by using indirect measures instead of the classic specification based testing. In this work we propose the use of Kendall's Tau rank correlation coeflicient for rating the suitability of a set of candidate indirect measures to be used in mixed-signal testing. Such criterion is shown to be adequate since it allows to avoid or minimize information redundancy in the measures set. As a proof of concept, a 4th order band-pass Butterworth filter has been simulated under the presence of process variations. The circuit has been tested using a subset of measures selected according to minimum Kendall's Tau coeflicient. Analog test efliciency metrics are reported showing test misclassification rate is among the best 15% possible, therefore validating the proposal. |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura |
dc.subject.lcsh | Linear integrated circuits |
dc.subject.lcsh | Mixed signal circuits |
dc.subject.other | Mixed-Signal Test |
dc.subject.other | Analog Test |
dc.subject.other | Alternate Test |
dc.subject.other | Indirect Measurements |
dc.subject.other | Alternate Feature Selection |
dc.subject.other | Signature Selection |
dc.subject.other | Optimum Measures Selection |
dc.subject.other | Quadtrees |
dc.subject.other | Octrees |
dc.subject.other | Analog Filter |
dc.title | Criteria for indirect measurements in M-S testing |
dc.type | Conference report |
dc.subject.lemac | Circuits integrats lineals |
dc.subject.lemac | Circuits integrats mixtos |
dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.rights.access | Restricted access - author's decision |
local.identifier.drac | 14991375 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Álvaro Gómez-Pau; Balado, L.; Figueras, J. |
local.citation.contributor | Workshop on Statistical Test Methods |
local.citation.pubplace | Paderborn |
local.citation.publicationName | Handout of papers: 1st Workshop on statistical test methods: 29-30 May 2014, Paderborn, germany: fringe event to ETS 2014 |
local.citation.startingPage | 1 |
local.citation.endingPage | 6 |