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Criteria for indirect measurements in M-S testing

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hdl:2117/26217

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Gómez Pau, ÁlvaroMés informacióMés informacióMés informació
Balado Suárez, Luz MaríaMés informacióMés informacióMés informació
Figueras Pàmies, JoanMés informació
Document typeConference report
Defense date2014
Rights accessRestricted access - author's decision
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
Analog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog and M-S circuits by using indirect measures instead of the classic specification based testing. In this work we propose the use of Kendall's Tau rank correlation coeflicient for rating the suitability of a set of candidate indirect measures to be used in mixed-signal testing. Such criterion is shown to be adequate since it allows to avoid or minimize information redundancy in the measures set. As a proof of concept, a 4th order band-pass Butterworth filter has been simulated under the presence of process variations. The circuit has been tested using a subset of measures selected according to minimum Kendall's Tau coeflicient. Analog test efliciency metrics are reported showing test misclassification rate is among the best 15% possible, therefore validating the proposal.
CitationÁlvaro Gómez-Pau; Balado, L.; Figueras, J. Criteria for indirect measurements in M-S testing. A: Workshop on Statistical Test Methods. "Handout of papers: 1st Workshop on statistical test methods: 29-30 May 2014, Paderborn, germany: fringe event to ETS 2014". Paderborn: 2014, p. 1-6. 
URIhttp://hdl.handle.net/2117/26217
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  • QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades - Ponències/Comunicacions de congressos [60]
  • QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat - Ponències/Comunicacions de congressos [78]
  • Departament d'Enginyeria Electrònica - Ponències/Comunicacions de congressos [1.816]
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