Reliability challenges in design of memristive memories
Document typeConference report
Rights accessOpen Access
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
CitationPouyan, P.; Amat, E.; Rubio, A. Reliability challenges in design of memristive memories. A: European workshop on CMOS Variability. "Proceedings VARI 2014". Palma Mallorca: 2014.