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Error resilient real-time state variable systems signal processing and control
dc.contributor.author | Banerjee, Suvadeep |
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Chatterjee, Abhijit |
dc.contributor.author | Abraham, Jacob |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2015-01-14T17:23:47Z |
dc.date.created | 2014 |
dc.date.issued | 2014 |
dc.identifier.citation | Banerjee, S. [et al.]. Error resilient real-time state variable systems signal processing and control. A: Asian Test Symposium. "Asian Test Symposium". Hangzhou: 2014, p. 39-44. |
dc.identifier.uri | http://hdl.handle.net/2117/25523 |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Electronics |
dc.title | Error resilient real-time state variable systems signal processing and control |
dc.type | Conference report |
dc.subject.lemac | Enginyeria electrònica |
dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.identifier.doi | 10.1109/ATS.2014.19 |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 15358980 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Banerjee, S.; Álvaro Gómez-Pau; Chatterjee, A.; Abraham, J. |
local.citation.contributor | Asian Test Symposium |
local.citation.pubplace | Hangzhou |
local.citation.publicationName | Asian Test Symposium |
local.citation.startingPage | 39 |
local.citation.endingPage | 44 |