Quality metrics for mixed-signal indirect testing
Document typeConference report
Defense date2014
Rights accessOpen Access
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is licensed under a Creative Commons license
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Attribution-NonCommercial-NoDerivs 3.0 Spain
CitationÁlvaro Gómez-Pau; Balado, L.; Figueras, J. Quality metrics for mixed-signal indirect testing. A: Design of Circuits and Integrated Systems Conference. "XXIX Conference on Design of Circuits and Integrated Systems". Madrid: 2014, p. 1-6.
Publisher versionhttp://www.cei.upm.es/dcis/
Collections
- QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades - Ponències/Comunicacions de congressos [60]
- QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat - Ponències/Comunicacions de congressos [78]
- Departament d'Enginyeria Electrònica - Ponències/Comunicacions de congressos [1.727]
| Files | Description | Size | Format | View |
|---|---|---|---|---|
| dcis2014.pdf | Quality Metrics for Mixed-Signal Indirect Testing | 3,067Mb | View/Open |