Mostra el registre d'ítem simple

dc.contributor.authorWeiner, Michael
dc.contributor.authorManich Bou, Salvador
dc.contributor.authorSigl, Georg
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2014-12-10T10:20:46Z
dc.date.created2014
dc.date.issued2014
dc.identifier.citationWeiner, M.; Manich, S.; Sigl, G. A low area probing detector for security IC's. A: Workshop on Trustworthy Manufacturing and Utilization of Secure Devices. "Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, TRUDEVICE 2014". Paderborn: 2014, p. 1-6.
dc.identifier.urihttp://hdl.handle.net/2117/24973
dc.description.abstractIn this paper, a low cost, Low Area Probing Detector (LAPD) is presented. Probing or microprobing is an attack technique against integrated circuits implementing security functions, such as OTP tokens or smartcards. It allows intercepting secrets from on-chip wires as well as injecting faults for other attacks. Microprobing is invasive as classi ed by Skorobogatov in 2005 and requires opening the microchip package as well as removing the passivation layer. While it may sound complicated and expensive, Maier and Nohl showed in 2012 that microprobing is feasible for low-budget adversaries. However, existing protection techniques against microprobing, such as active shields, redundancy of core components, or analog detection circuits containing large capacitors, are still expensive. The LAPD provides low-cost protection against microprobing. It measures minimal timing di erences between on-chip wires caused by the capacitive load of microprobes. As a novelty, it is merely based on digital components and does not require analog circuitry, which reduces the required area and process steps compared to previous approaches. Simulations show that the LAPD can detect up-to-date probes with capacitances as low as 10 fF.
dc.format.extent6 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Informàtica::Seguretat informàtica
dc.subject.lcshComputer security
dc.subject.otherhardware security countermeasures
dc.subject.otherDigital Integrated Circuits
dc.subject.otherSecurity
dc.subject.otherSmart Cards
dc.subject.otherData Buses
dc.subject.otherMicroprobing
dc.subject.otherInvasive Attacks
dc.titleA low area probing detector for security IC's
dc.typeConference report
dc.subject.lemacSeguretat informàtica
dc.contributor.groupUniversitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac14914850
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorWeiner, M.; Manich, S.; Sigl, G.
local.citation.contributorWorkshop on Trustworthy Manufacturing and Utilization of Secure Devices
local.citation.pubplacePaderborn
local.citation.publicationNameWorkshop on Trustworthy Manufacturing and Utilization of Secure Devices, TRUDEVICE 2014
local.citation.startingPage1
local.citation.endingPage6


Fitxers d'aquest items

Imatge en miniatura

Aquest ítem apareix a les col·leccions següents

Mostra el registre d'ítem simple