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dc.contributor.authorJauregui Telleria, Ricardo Ignacio
dc.contributor.authorZhang, Gang
dc.contributor.authorRojas Mora, Julio
dc.contributor.authorVentosa Llopart, Josep Oriol
dc.contributor.authorSilva Martínez, Fernando
dc.contributor.authorDuffy, Alistair P.
dc.contributor.authorSasse, Hugh
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2014-10-09T16:10:17Z
dc.date.created2014-08-01
dc.date.issued2014-08-01
dc.identifier.citationJaúregui, R.I. [et al.]. Analyzing transient phenomena in the time domain using the Feature Selective Validation (FSV) method. "IEEE transactions on electromagnetic compatibility", 01 Agost 2014, vol. 56, núm. 4, p. 825-834.
dc.identifier.issn0018-9375
dc.identifier.urihttp://hdl.handle.net/2117/24329
dc.description.abstractThe increasing application of simulation tools to increasingly complex problems makes the use of validation tools essential to improve confidence in the veracity of those simulation results. IEEE Standard 1597.1 is the first true standard for the validation of computational electromagnetics method. This standard uses the feature selective validation (FSV) method as the key quantification tool. However, despite its many advantages, there have been some interesting issues surrounding the validation of transients. This paper presents a new approach to the validation of a set of generally representative transient types using the FSV method and shows how the previously experienced limitations can be overcome. In order to analyze the main parameters associated with transient comparison, a survey which included 20 experts was conducted. This information was used to identify the significant regions that need to be taken into account in the transient comparison. Finally, using the statistics obtained by the experts, a new solution was defined and its improvement over the existing approach was demonstrated.
dc.format.extent10 p.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Física::Electromagnetisme
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectromagnetisme -- Matemàtica
dc.subject.otherComputational electromagnetics method (CEM)
dc.subject.otherComputer simulation
dc.subject.otherData comparison
dc.subject.otherFeature selective validation (FSV) method
dc.subject.otherNumerical simulation
dc.subject.otherTransient
dc.subject.otherValidation
dc.subject.otherComputational electromagnetics CEM
dc.subject.otherPerformance
dc.titleAnalyzing transient phenomena in the time domain using the Feature Selective Validation (FSV) method
dc.typeArticle
dc.subject.lemacElectromagnetism -- Mathematics
dc.contributor.groupUniversitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
dc.identifier.doi10.1109/TEMC.2013.2246167
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6518138
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac15076088
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorJaúregui, R.I.; Zhang, G.; Rojas, J.; Ventosa, O.; Silva, F.; Duffy, A.; Sasse, H.
local.citation.publicationNameIEEE transactions on electromagnetic compatibility
local.citation.volume56
local.citation.number4
local.citation.startingPage825
local.citation.endingPage834


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