Enviaments recents

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  Transient Attosecond Soft-X-Ray Spectroscopy in Layered Semi-Metals 

  Sidiropolous, T. P.H.; Di Palo, N.; Rivas, D. E.; Severino, S.; Reduzzi, M.; Buades, B.; Leon, I.; Cousin, S. L.; Hemmer, M.; Cocchi, C.; Pellegrin, E.; Herrero Martin, J.; Mañas-Valero, S.; Coronado, E.; Danz, T.; Draxi, C.; Uemoto, M.; Yabana, K.; Schultze, Martin; Wall, Simon; Picon, A.; Biegert, Jens (SPIE, 2020)
  Comunicació de congrés
  Accés obert

  X-ray absorption fine-structure (XAFS) spectroscopy is a well-established technique capable of extracting information about a material’s electronic and lattice structure with atomic resolution. While the near-edge region ...