Cross-talk extraction from mask layout

The principles of an automated cross-talk extractor from the mask-level description of a CMOS integrated circuit are detailed. The physical extraction principles, the techniques for parasitic coupling evaluation and modeling, the technique for back-annotating the schematic diagram of the integrated circuit are presented. A model for mixed-level simulation is proposed, covering various parasitic effects of the cross-talk phenomenon. The efficiency of the cross-talk extractor is demonstrated through the analysis of mixed digital/analog CMOS integrated circuits where critical couplings are predicted and eliminated

CitationSicard, E. [et al.]. Cross-talk extraction from mask layout. A: European Conference on Design Automation. "EDAC: European Conference on Design Automation: Amsterdam, The Netherlands: 25-28 February 1993". Institute of Electrical and Electronics Engineers (IEEE), 1993, p. 414-418.

URIhttp://hdl.handle.net/2117/23652

DOI10.1109/EDAC.1993.386440

ISBN0-8186-3410-3

Publisher versionhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=386440&tag=1

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