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dc.contributor.authorCarrasco, Juan A.
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2014-07-02T11:53:47Z
dc.date.available2014-07-03T06:00:45Z
dc.date.created1994
dc.date.issued1994
dc.identifier.citationCarrasco, J. Improving availability bounds using the failure distance concept. A: IFIP Working Conferences on Dependable Computing for Critical Applications. "Dependable computing for critical applications 4: [presented at the Fourth International IFIP Working Conference on Dependable Computing for Critical Applications held in San Diego, California on January 4 - 6, 1994]". Springer, 1994, p. 479-497.
dc.identifier.isbn978-3-7091-9398-3
dc.identifier.urihttp://hdl.handle.net/2117/23388
dc.description.abstractContinuous-time Markov chains are commonly used for dependability modeling of repairable fault-tolerant computer systems. Realistic models of non-trivial fault-tolerant systems easily have very large state spaces. An attractive approach which has been proposed to deal with the largeness problem is the use of pruning-based methods which provide error bounds. Using results from Courtois and Semal, a method for bounding the steady-state availability has been recently developed by Muntz, de Souza e Silva, and Goyal. This paper presents a new method based on a different approach which exploits the concept of failure distance to better bound the behavior out of the non-generated state space. The proposed method yields tighter bounds. Numerical analysis shows that the improvement is typically significant.
dc.format.extent19 p.
dc.language.isoeng
dc.publisherSpringer
dc.subjectÀrees temàtiques de la UPC::Informàtica::Sistemes d'informació
dc.subjectÀrees temàtiques de la UPC::Matemàtiques i estadística::Probabilitat
dc.subject.lcshMarkov processes
dc.titleImproving availability bounds using the failure distance concept
dc.typeConference lecture
dc.subject.lemacMarkov, Processos de
dc.contributor.groupUniversitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.rights.accessOpen Access
drac.iddocument2558984
dc.description.versionPostprint (published version)
upcommons.citation.authorCarrasco, J.
upcommons.citation.contributorIFIP Working Conferences on Dependable Computing for Critical Applications
upcommons.citation.publishedtrue
upcommons.citation.publicationNameDependable computing for critical applications 4: [presented at the Fourth International IFIP Working Conference on Dependable Computing for Critical Applications held in San Diego, California on January 4 - 6, 1994]
upcommons.citation.startingPage479
upcommons.citation.endingPage497


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