Mostra el registre d'ítem simple
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | González, José Luis |
dc.contributor.author | Gómez Salinas, Dídac |
dc.contributor.author | Perpiñà Gilabet, Xavier |
dc.contributor.author | Claeys, Wilfrid |
dc.contributor.author | Grauby, Stéphane |
dc.contributor.author | Dufis, Cédric Yvan |
dc.contributor.author | Vellvehi, Miquel |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Reverter Cubarsí, Ferran |
dc.contributor.author | Dilhaire, Stefan |
dc.contributor.author | Jordà, Xavier |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2014-06-12T13:27:47Z |
dc.date.created | 2014-05 |
dc.date.issued | 2014-05 |
dc.identifier.citation | Altet, J. [et al.]. Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. "Microelectronics journal", Maig 2014, vol. 45, núm. 5, p. 484-490. |
dc.identifier.issn | 0026-2692 |
dc.identifier.uri | http://hdl.handle.net/2117/23207 |
dc.description.abstract | This paper reports on the design solutions and the different measurements we have done in order to characterize the thermal coupling and the performance of differential temperature sensors embedded in an integrated circuit implemented in a 65 nm CMOS technology. The on-chip temperature increases have been generated using diode-connected MOS transistors behaving as heat sources. Temperature measurements performed with the embedded sensor are corroborated with an infra-red camera and a laser interferometer used as thermometer. A 2 GHz linear power amplifier (PA) is as well embedded in the same silicon die. In this paper we show that temperature measurements performed with the embedded temperature sensor can be used to monitor the PA DC behavior and RF activity. |
dc.format.extent | 7 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject.lcsh | Integrated circuits |
dc.subject.other | CMOS differential temperature sensors |
dc.subject.other | CMOS integrated circuits |
dc.subject.other | Electro-thermal characterization |
dc.subject.other | IR camera measurements |
dc.subject.other | Laser interferometer measurements |
dc.subject.other | Thermal coupling characterization |
dc.title | Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers |
dc.type | Article |
dc.subject.lemac | Circuits integrats |
dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.group | Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics |
dc.identifier.doi | 10.1016/j.mejo.2014.02.009 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://www.sciencedirect.com/science/article/pii/S0026269214000354 |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 14924713 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Altet, J.; González, J.; Gómez, D.; Perpiñà, X.; Claeys, W.; Grauby, S.; Dufis, C.; Vellvehi, M.; Mateo, D.; Reverter, F.; Dilhaire, S.; Jordà, X. |
local.citation.publicationName | Microelectronics journal |
local.citation.volume | 45 |
local.citation.number | 5 |
local.citation.startingPage | 484 |
local.citation.endingPage | 490 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [92]
-
Articles de revista [35]
-
Articles de revista [1.728]