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Unlocking higher harmonics in atomic force microscopy with gentle interactions
dc.contributor.author | Santos Hernández, Sergio |
dc.contributor.author | Barcons Xixons, Víctor |
dc.contributor.author | Font Teixidó, Josep |
dc.contributor.author | Verdaguer Prats, Albert |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
dc.date.accessioned | 2014-05-06T14:12:40Z |
dc.date.available | 2014-05-06T14:12:40Z |
dc.date.created | 2014-03-11 |
dc.date.issued | 2014-03-11 |
dc.identifier.citation | Santos, S. [et al.]. Unlocking higher harmonics in atomic force microscopy with gentle interactions. "Beilstein Journal of Nanotechnology", 11 Març 2014, vol. 5, p. 268-277. |
dc.identifier.issn | 2190-4286 |
dc.identifier.uri | http://hdl.handle.net/2117/22859 |
dc.description.abstract | In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, we propose to externally drive an arbitrary number of exact higher harmonics above the noise level. In this way, multiple contrast channels that are sensitive to compositional variations are made accessible. Numerical integration of the equation of motion shows that the external introduction of exact harmonic frequencies does not compromise the fundamental frequency. Thermal fluctuations are also considered within the detection bandwidth of interest and discussed in terms of higher-harmonic phase contrast in the presence and absence of an external excitation of higher harmonics. Higher harmonic phase shifts further provide the means to directly decouple the true topography from that induced by compositional heterogeneity. |
dc.format.extent | 10 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Física |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Atomic force microscopy |
dc.subject.lcsh | Nanotechnology |
dc.subject.other | Atomic force microscopy |
dc.subject.other | Chemistry |
dc.subject.other | Composition |
dc.subject.other | Heterogeneity |
dc.subject.other | Higher harmonics |
dc.subject.other | Phase |
dc.subject.other | Molecular resolution |
dc.subject.other | Sosft matter |
dc.subject.other | Mode |
dc.subject.other | AFM |
dc.subject.other | Liquid |
dc.subject.other | Cells |
dc.subject.other | Live |
dc.title | Unlocking higher harmonics in atomic force microscopy with gentle interactions |
dc.type | Article |
dc.subject.lemac | Microscòpia de força atòmica |
dc.subject.lemac | Nanotecnologia |
dc.contributor.group | Universitat Politècnica de Catalunya. CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació |
dc.identifier.doi | 10.3762/bjnano.5.29 |
dc.description.peerreviewed | Peer Reviewed |
dc.rights.access | Open Access |
local.identifier.drac | 14143287 |
dc.description.version | Postprint (published version) |
local.citation.author | Santos, S.; Barcons, V.; Font, J.; Verdaguer, A. |
local.citation.publicationName | Beilstein Journal of Nanotechnology |
local.citation.volume | 5 |
local.citation.startingPage | 268 |
local.citation.endingPage | 277 |
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