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dc.contributor.authorSantos Hernández, Sergio
dc.contributor.authorBarcons Xixons, Víctor
dc.contributor.authorFont Teixidó, Josep
dc.contributor.authorVerdaguer Prats, Albert
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.date.accessioned2014-05-06T14:12:40Z
dc.date.available2014-05-06T14:12:40Z
dc.date.created2014-03-11
dc.date.issued2014-03-11
dc.identifier.citationSantos, S. [et al.]. Unlocking higher harmonics in atomic force microscopy with gentle interactions. "Beilstein Journal of Nanotechnology", 11 Març 2014, vol. 5, p. 268-277.
dc.identifier.issn2190-4286
dc.identifier.urihttp://hdl.handle.net/2117/22859
dc.description.abstractIn dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, we propose to externally drive an arbitrary number of exact higher harmonics above the noise level. In this way, multiple contrast channels that are sensitive to compositional variations are made accessible. Numerical integration of the equation of motion shows that the external introduction of exact harmonic frequencies does not compromise the fundamental frequency. Thermal fluctuations are also considered within the detection bandwidth of interest and discussed in terms of higher-harmonic phase contrast in the presence and absence of an external excitation of higher harmonics. Higher harmonic phase shifts further provide the means to directly decouple the true topography from that induced by compositional heterogeneity.
dc.format.extent10 p.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Física
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshAtomic force microscopy
dc.subject.lcshNanotechnology
dc.subject.otherAtomic force microscopy
dc.subject.otherChemistry
dc.subject.otherComposition
dc.subject.otherHeterogeneity
dc.subject.otherHigher harmonics
dc.subject.otherPhase
dc.subject.otherMolecular resolution
dc.subject.otherSosft matter
dc.subject.otherMode
dc.subject.otherAFM
dc.subject.otherLiquid
dc.subject.otherCells
dc.subject.otherLive
dc.titleUnlocking higher harmonics in atomic force microscopy with gentle interactions
dc.typeArticle
dc.subject.lemacMicroscòpia de força atòmica
dc.subject.lemacNanotecnologia
dc.contributor.groupUniversitat Politècnica de Catalunya. CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació
dc.identifier.doi10.3762/bjnano.5.29
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
drac.iddocument14143287
dc.description.versionPostprint (published version)
upcommons.citation.authorSantos, S.; Barcons, V.; Font, J.; Verdaguer, A.
upcommons.citation.publishedtrue
upcommons.citation.publicationNameBeilstein Journal of Nanotechnology
upcommons.citation.volume5
upcommons.citation.startingPage268
upcommons.citation.endingPage277


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