Modeling and simulation of conducting crack propagation in ferroelectric single crystals under purely electrical loading
Document typeConference report
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We present a phase-field model of fracture in ferroelectric single crystals for the simulation of conducting crack propagation under purely electrical loading. This is done by introducing the electrical enthalpy of a diffuse conducting layer into the phase-field formulation. Simulation results show an oblique crack propagation and crack branching from a conducting notch in a ferroelectric sample under applied electric fields. Microstructure evolution indicates the formation of 90 domains which results in a charge accumulation around the crack. The charge accumulation, in turn, induces a high electric field and hence a high electrostatic energy for driving the conducting crack.
CitationAbdollahi, A.; Arias, I. Modeling and simulation of conducting crack propagation in ferroelectric single crystals under purely electrical loading. A: International Conference on Computational Plasticity Fundamentals and Applications. "Computational Plasticity XII: Fundamentals and Applications. Proceedings of the XII International Conference on Computational Plasticity – Fundamentals and Applications Barcelona, Spain3 - 5 September 2013". Barcelona: 2013, p. 400-406.
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