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dc.contributor.authorAmat Bertran, Esteve
dc.contributor.authorCalomarde Palomino, Antonio
dc.contributor.authorRubio Sola, Jose Antonio
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2014-01-03T10:34:09Z
dc.date.created2013
dc.date.issued2013
dc.identifier.citationAmat, E.; Calomarde, A.; Rubio, J.A. Reliability study on technology trends beyond 20nm. A: International Conference Mixed Design of Integrated Circuits and Systems. "Mixed design of integrated circuits and systems MIXDES 2013: proceedings of the 20th international conference: Gdynia, Poland: 20-22 June 2013". Gdynia: Lodz University of Technology, 2013, p. 414-418.
dc.identifier.isbn978-83-63578-01-5
dc.identifier.urihttp://hdl.handle.net/2117/21142
dc.description.abstractIn this work, an assessment of different technology trends (planar CMOS, FinFET and III-V MOSFETs) has been carried out in front of some different reliability scenarios (variability and soft errors). The logic circuits based on FinFET devices have presented the best overall behavior, since we have obtained the best performance and variability robustness. Meanwhile, the III-V/Ge-based circuits have shown the best electrical masking in front of soft errors disturbances.
dc.format.extent5 p.
dc.language.isoeng
dc.publisherLodz University of Technology
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
dc.subject.lcshSemiconductors
dc.titleReliability study on technology trends beyond 20nm
dc.typeConference report
dc.subject.lemacSemiconductors
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.relation.publisherversionhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6613386
dc.rights.accessRestricted access - publisher's policy
drac.iddocument12881089
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
upcommons.citation.authorAmat, E.; Calomarde, A.; Rubio, J.A.
upcommons.citation.contributorInternational Conference Mixed Design of Integrated Circuits and Systems
upcommons.citation.pubplaceGdynia
upcommons.citation.publishedtrue
upcommons.citation.publicationNameMixed design of integrated circuits and systems MIXDES 2013: proceedings of the 20th international conference: Gdynia, Poland: 20-22 June 2013
upcommons.citation.startingPage414
upcommons.citation.endingPage418


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