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Reliability study on technology trends beyond 20nm
| dc.contributor.author | Amat Bertran, Esteve |
| dc.contributor.author | Calomarde Palomino, Antonio |
| dc.contributor.author | Rubio Sola, Jose Antonio |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2014-01-03T10:34:09Z |
| dc.date.created | 2013 |
| dc.date.issued | 2013 |
| dc.identifier.citation | Amat, E.; Calomarde, A.; Rubio, J.A. Reliability study on technology trends beyond 20nm. A: International Conference Mixed Design of Integrated Circuits and Systems. "Mixed design of integrated circuits and systems MIXDES 2013: proceedings of the 20th international conference: Gdynia, Poland: 20-22 June 2013". Gdynia: Lodz University of Technology, 2013, p. 414-418. |
| dc.identifier.isbn | 978-83-63578-01-5 |
| dc.identifier.uri | http://hdl.handle.net/2117/21142 |
| dc.description.abstract | In this work, an assessment of different technology trends (planar CMOS, FinFET and III-V MOSFETs) has been carried out in front of some different reliability scenarios (variability and soft errors). The logic circuits based on FinFET devices have presented the best overall behavior, since we have obtained the best performance and variability robustness. Meanwhile, the III-V/Ge-based circuits have shown the best electrical masking in front of soft errors disturbances. |
| dc.format.extent | 5 p. |
| dc.language.iso | eng |
| dc.publisher | Lodz University of Technology |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
| dc.subject.lcsh | Semiconductors |
| dc.title | Reliability study on technology trends beyond 20nm |
| dc.type | Conference report |
| dc.subject.lemac | Semiconductors |
| dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
| dc.relation.publisherversion | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6613386 |
| dc.rights.access | Restricted access - publisher's policy |
| local.identifier.drac | 12881089 |
| dc.description.version | Postprint (published version) |
| dc.date.lift | 10000-01-01 |
| local.citation.author | Amat, E.; Calomarde, A.; Rubio, J.A. |
| local.citation.contributor | International Conference Mixed Design of Integrated Circuits and Systems |
| local.citation.pubplace | Gdynia |
| local.citation.publicationName | Mixed design of integrated circuits and systems MIXDES 2013: proceedings of the 20th international conference: Gdynia, Poland: 20-22 June 2013 |
| local.citation.startingPage | 414 |
| local.citation.endingPage | 418 |