A nanometric displacement measurement system using differential optical feedback interferometry

Thumbnail
View/Open
A nanometric displacement.pdf (1,534Mb) (Restricted access)   Request copy 
Azcona Guerrero, Francisco JavierMés informació
Atashkhooei, Reza
Royo Royo, SantiagoMés informacióMés informació
Méndez Astudillo, Jorge
Jha, Ajit
Document typeArticle
Defense date2013-11-01
Rights accessRestricted access - publisher's policy
CitationAzcona, F. [et al.]. A nanometric displacement measurement system using differential optical feedback interferometry. "IEEE photonics technology letters", 01 Novembre 2013, vol. 25, núm. 21, p. 2074-2077. 
URIhttp://hdl.handle.net/2117/21004
DOI10.1109/LPT.2013.2281269
ISSN1041-1135
Publisher versionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6595025
Collections

FilesDescriptionSizeFormatView
A nanometric displacement.pdfBlocked1,534MbPDFRestricted access
Attribution-NonCommercial-NoDerivs 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain