A nanometric displacement measurement system using differential optical feedback interferometry

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Azcona Guerrero, Francisco JavierMés informació
Atashkhooei, Reza
Royo Royo, SantiagoMés informacióMés informació
Méndez Astudillo, Jorge
Jha, Ajit
Document typeArticle
Date issued2013-11-01
Rights accessRestricted access - publisher's policy
CitationAzcona, F. [et al.]. A nanometric displacement measurement system using differential optical feedback interferometry. "IEEE photonics technology letters", 01 Novembre 2013, vol. 25, núm. 21, p. 2074-2077. 
URIhttp://hdl.handle.net/2117/21004
DOI10.1109/LPT.2013.2281269
ISSN1041-1135
Publisher versionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6595025
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