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dc.contributor.authorGómez Pau, Álvaro
dc.contributor.authorSanahuja Moliner, Ricard
dc.contributor.authorBalado Suárez, Luz María
dc.contributor.authorFigueras Pàmies, Joan
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.date.accessioned2013-11-15T15:47:18Z
dc.date.available2013-11-15T15:47:18Z
dc.date.created2010
dc.date.issued2010
dc.identifier.citationÁlvaro Gómez-Pau [et al.]. Analog circuit test based on a digital signature. A: Design, Automation and Test in Europe. "Proceedings: Design, Automation & Test in Europe: Dresden, Germany, March 8-12, 2010". Dresden: 2010, p. 1641-1644.
dc.identifier.urihttp://hdl.handle.net/2117/20632
dc.description.abstractProduction verification of analog circuit specifica- tions is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost on-chip parameter verification based on the analysis of a digital signature. A 65 nm CMOS on-chip monitor is proposed and validated in practice. The monitor composes two signals (x(t), y(t)) and divides the X-Y plane with nonlinear boundaries in order to generate a digital code for every analog (x, y) location. A digital signature is obtained using the digital code and its time duration. A metric defining a discrepancy factor is used to verify circuit parameters. The method is applied to detect possible deviations in the natural frequency of a Biquad filter. Simulated and experimental results show the possibilities of the proposal.
dc.format.extent4 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
dc.subjectÀrees temàtiques de la UPC::Informàtica::Seguretat informàtica::Criptografia
dc.subject.lcshMonitoring
dc.subject.lcshDigital signatures
dc.subject.lcshLinear integrated circuits
dc.titleAnalog circuit test based on a digital signature
dc.typeConference report
dc.subject.lemacMonitoratge
dc.subject.lemacSignatures electròniques
dc.subject.lemacCircuits integrats lineals
dc.contributor.groupUniversitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://www.date-conference.com/proceedings/PAPERS/2010/YEAR.HTM
dc.rights.accessOpen Access
local.identifier.drac8826776
dc.description.versionPostprint (published version)
local.citation.authorÁlvaro Gómez-Pau; Sanahuja, R.; Balado, L.; Figueras, J.
local.citation.contributorDesign, Automation and Test in Europe
local.citation.pubplaceDresden
local.citation.publicationNameProceedings: Design, Automation & Test in Europe: Dresden, Germany, March 8-12, 2010
local.citation.startingPage1641
local.citation.endingPage1644


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