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Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging
dc.contributor.author | Santos Hernández, Sergio |
dc.contributor.author | Barcons Xixons, Víctor |
dc.contributor.author | Christenson, Hugo K. |
dc.contributor.author | Billingsley, Daniel J. |
dc.contributor.author | Bonass, William A. |
dc.contributor.author | Font Teixidó, Josep |
dc.contributor.author | Thomson, Neil H. |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
dc.date.accessioned | 2013-10-03T17:28:18Z |
dc.date.available | 2013-10-03T17:28:18Z |
dc.date.created | 2013 |
dc.date.issued | 2013 |
dc.identifier.citation | Santos , S. [et al.]. Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging. "Applied physics letters", 2013, vol. 103, núm. 6, p. 1-4. |
dc.identifier.issn | 0003-6951 |
dc.identifier.uri | http://hdl.handle.net/2117/20287 |
dc.description.abstract | A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 h). In small amplitude smal l set-point (SASS) imaging, the cantilever oscillates with sub-nanometer am plitudes in the proximity of the sample, without the requirement of using large drive forces, a s the dynamics smoothly lead the tip to the surface through the water layer. SASS is demonstrat ed on single molecules of double-stranded DNA in ambient conditions where sharp silicon tips (R 2–5 nm) can resolve the right-handed double helix |
dc.format.extent | 4 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria química::Biotecnologia |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Atomic force microscopy |
dc.subject.lcsh | Molecular biology |
dc.subject.lcsh | Modulation (Electronics) |
dc.subject.other | Amplitude modulation Atomic force microscopy |
dc.title | Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging |
dc.type | Article |
dc.subject.lemac | Microscòpia de força atòmica |
dc.subject.lemac | Biologia molecular |
dc.subject.lemac | Modulació (Electrònica) |
dc.contributor.group | Universitat Politècnica de Catalunya. CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació |
dc.identifier.doi | 10.1063/1.4817906 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://apl.aip.org/resource/1/applab/v103/i6/p063702_s1 |
dc.rights.access | Open Access |
local.identifier.drac | 12775730 |
dc.description.version | Postprint (published version) |
local.citation.author | Santos , S.; Barcons, V.; Christenson, H.K.; Billingsley, D.J.; Bonass, W.A.; Font, J.; Thomson, N. |
local.citation.publicationName | Applied physics letters |
local.citation.volume | 103 |
local.citation.number | 6 |
local.citation.startingPage | 1 |
local.citation.endingPage | 4 |
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