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dc.contributor.authorManich Bou, Salvador
dc.contributor.authorStrasser, Martin
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2013-09-18T06:54:43Z
dc.date.created2013-09-05
dc.date.issued2013-09-05
dc.identifier.citationManich, S.; Strasser, M. A Highly time sensitive XOR gate for probe attempt detectors. "IEEE transactions on circuits and systems II: express briefs", 05 Setembre 2013.
dc.identifier.issn1549-7747
dc.identifier.urihttp://hdl.handle.net/2117/20153
dc.description.abstractProbe attempt detectors are sensors designed to protect buses of secure chips against the physical contact of probes. The operation principle of these detectors relies on the comparison of the delay propagation times between lines. CMOS XOR gates are very well suited for this comparison since they are small, fast, and compatible with the technology used in secure chips. However, the lack of activity while comparing matched lines and the limited reaction time pose a risk for tampering and decrease the sensitivity of the sensor, respectively. In this brief, a modification of a CMOS XOR gate is presented, which solves both the aforementioned problems.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshMetal oxide semiconductors
dc.subject.otherCMOS integrated circuits logic gates phase detection smart cards Delays Detectors Logic gates Probes Standards Transistors
dc.titleA Highly time sensitive XOR gate for probe attempt detectors
dc.typeArticle
dc.subject.lemacMetall-òxid-semiconductors
dc.contributor.groupUniversitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.identifier.doi10.1109/TCSII.2013.2278126
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6589211
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac12762561
dc.description.versionPostprint (published version)
local.citation.authorManich, S.; Strasser, M.
local.citation.publicationNameIEEE transactions on circuits and systems II: express briefs


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