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Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits
dc.contributor.author | Boyer, Alexandre |
dc.contributor.author | Dhia, Sonia Ben |
dc.contributor.author | Fernández García, Raúl |
dc.contributor.author | Berbel Artal, Néstor |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2013-09-17T08:28:03Z |
dc.date.created | 2013-07-18 |
dc.date.issued | 2013-07-18 |
dc.identifier.citation | Boyer, A. [et al.]. Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits. "IEEE transactions on electromagnetic compatibility", 18 Juliol 2013, p. 1-7. |
dc.identifier.issn | 0018-9375 |
dc.identifier.uri | http://hdl.handle.net/2117/20145 |
dc.description.abstract | Recent studies have shown that the aging of integrated circuits may modify electromagnetic emission significantly. This paper reports on an experiment to elucidate the origins of emis- sion level changes in a test chip using 90-nm CMOS technology. Circuit analysis, combined with electromagnetic emission and on- chip power supply voltage bounce measurements made during the application of electric stress, have identified the role of intrinsic wear-out mechanisms, which contribute to a progressive change in the transient current produced by the circuit. |
dc.format.extent | 7 p. |
dc.language.iso | eng |
dc.subject.lcsh | Semiconductors |
dc.subject.lcsh | Electronic circuits |
dc.subject.other | Aging effects |
dc.subject.other | electromagnetic emission |
dc.subject.other | integrated circuits |
dc.subject.other | semiconductor device reliability |
dc.title | Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits |
dc.type | Article |
dc.subject.lemac | Semiconductors |
dc.subject.lemac | Electromagnetisme |
dc.subject.lemac | Circuits integrats |
dc.subject.lemac | Electromagnetism |
dc.contributor.group | Universitat Politècnica de Catalunya. (TIEG) - Terrassa Industrial Electronics Group |
dc.identifier.doi | 10.1109/TEMC.2013.2272195 |
dc.description.peerreviewed | Peer Reviewed |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 12731259 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Boyer, A.; Dhia, S.; Fernandez, R.; Berbel, N. |
local.citation.publicationName | IEEE transactions on electromagnetic compatibility |
local.citation.startingPage | 1 |
local.citation.endingPage | 7 |
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