Mostra el registre d'ítem simple

dc.contributor.authorBoyer, Alexandre
dc.contributor.authorDhia, Sonia Ben
dc.contributor.authorFernández García, Raúl
dc.contributor.authorBerbel Artal, Néstor
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2013-09-17T08:28:03Z
dc.date.created2013-07-18
dc.date.issued2013-07-18
dc.identifier.citationBoyer, A. [et al.]. Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits. "IEEE transactions on electromagnetic compatibility", 18 Juliol 2013, p. 1-7.
dc.identifier.issn0018-9375
dc.identifier.urihttp://hdl.handle.net/2117/20145
dc.description.abstractRecent studies have shown that the aging of integrated circuits may modify electromagnetic emission significantly. This paper reports on an experiment to elucidate the origins of emis- sion level changes in a test chip using 90-nm CMOS technology. Circuit analysis, combined with electromagnetic emission and on- chip power supply voltage bounce measurements made during the application of electric stress, have identified the role of intrinsic wear-out mechanisms, which contribute to a progressive change in the transient current produced by the circuit.
dc.format.extent7 p.
dc.language.isoeng
dc.subject.lcshSemiconductors
dc.subject.lcshElectronic circuits
dc.subject.otherAging effects
dc.subject.otherelectromagnetic emission
dc.subject.otherintegrated circuits
dc.subject.othersemiconductor device reliability
dc.titleExperimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits
dc.typeArticle
dc.subject.lemacSemiconductors
dc.subject.lemacElectromagnetisme
dc.subject.lemacCircuits integrats
dc.subject.lemacElectromagnetism
dc.contributor.groupUniversitat Politècnica de Catalunya. (TIEG) - Terrassa Industrial Electronics Group
dc.identifier.doi10.1109/TEMC.2013.2272195
dc.description.peerreviewedPeer Reviewed
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac12731259
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorBoyer, A.; Dhia, S.; Fernandez, R.; Berbel, N.
local.citation.publicationNameIEEE transactions on electromagnetic compatibility
local.citation.startingPage1
local.citation.endingPage7


Fitxers d'aquest items

Imatge en miniatura

Aquest ítem apareix a les col·leccions següents

Mostra el registre d'ítem simple