| dc.contributor.author | Rodríguez Montañés, Rosa |
| dc.contributor.author | Arumi Delgado, Daniel |
| dc.contributor.author | Figueras Pàmies, Joan |
| dc.contributor.author | Eichenberger, S. |
| dc.contributor.author | Hora, Camelia |
| dc.contributor.author | Kruseman, B. |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2013-09-10T10:23:09Z |
| dc.date.available | 2013-09-10T10:23:09Z |
| dc.date.created | 2007-10 |
| dc.date.issued | 2007-10 |
| dc.identifier.citation | Rodriguez, R. [et al.]. Impact of gate tunnelling leakage on CMOS circuits with full open defects. "Electronics Letters", Octubre 2007, vol. 43, núm. Issue 21, p. 1140-1141. |
| dc.identifier.issn | 0013-5194 |
| dc.identifier.uri | http://hdl.handle.net/2117/20118 |
| dc.description | Electronics Letter of the Month |
| dc.description.abstract | Interconnecting lines with full open defects become floating lines. In nanometric CMOS technologies, gate tunnelling leakage currents impact the behaviour of these lines, which cannot be considered
electrically isolated anymore. The voltage of the floating node is determined by its neighbours and leakage currents. After some time an equilibrium is reached between these effects. Theoretical analysis and experimental evidence of this behaviour are presented. |
| dc.format.extent | 2 p. |
| dc.language.iso | eng |
| dc.publisher | Institution of Electrical Engineers |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
| dc.subject.lcsh | Metal oxide semiconductors, Complementary |
| dc.subject.lcsh | CMOS integrated circuits |
| dc.title | Impact of gate tunnelling leakage on CMOS circuits with full open defects |
| dc.type | Article |
| dc.subject.lemac | Circuits integrats -- CMOS -- Disseny i construcció |
| dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
| dc.identifier.doi | 10.1049/el:20072117 |
| dc.description.peerreviewed | Peer Reviewed |
| dc.description.awardwinning | Award-winning |
| dc.relation.publisherversion | http://ieeexplore.ieee.org/search/srchabstract.jsp?arnumber=4349252&isnumber=4349241&punumber=2220&k2dockey=4349252@ieejrns&query=%28%28arume%29%3Cin%3Emetadata+%29&pos=0 |
| dc.rights.access | Open Access |
| local.identifier.drac | 771634 |
| dc.description.version | Postprint (published version) |
| local.citation.author | Rodriguez, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B. |
| local.citation.publicationName | Electronics Letters |
| local.citation.volume | 43 |
| local.citation.number | Issue 21 |
| local.citation.startingPage | 1140 |
| local.citation.endingPage | 1141 |
