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dc.contributor.authorCarrasco, Juan A.
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2013-07-26T10:16:53Z
dc.date.available2013-07-26T10:16:53Z
dc.date.created2006
dc.date.issued2006
dc.identifier.citationCarrasco, J. Adapted importance sampling schemes for the simulation of dependability models of Fault-tolerant systems with deferred repair. A: IEEE Annual Simulation Symp.. "Proc. 39th IEEE Annual Simulation Symp.". 2006, p. 107-116.
dc.identifier.urihttp://hdl.handle.net/2117/20006
dc.description.abstractThis paper targets the simulation of continuous-time Markov chain models of fault-tolerant systems with deferred repair. We start by stating sufficient conditions for a given importance sampling scheme to satisfy the bounded relative error property. Using those sufficient conditions, it is noted that many previously proposed importance sampling techniques such as failure biasing and balanced failure biasing satisfy that property. Then, we adapt the importance sampling schemes failure transition distance biasing and balanced failure transition distance biasing so as to develop new importance sampling schemes which can be implemented with moderate effort and at the same time can be proved to be more efficient for balanced systems than the simpler failure biasing and balanced failure biasing schemes. The increased efficiency for both balanced and unbalanced systems of the new adapted importance sampling schemes is illustrated using examples.
dc.format.extent10 p.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Matemàtiques i estadística::Estadística matemàtica
dc.subject.lcshMarkov processes
dc.titleAdapted importance sampling schemes for the simulation of dependability models of Fault-tolerant systems with deferred repair
dc.typeConference report
dc.subject.lemacMarkov, Processos de
dc.contributor.groupUniversitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.rights.accessOpen Access
local.identifier.drac2422281
dc.description.versionPostprint (published version)
local.citation.authorCarrasco, J.
local.citation.contributorIEEE Annual Simulation Symp.
local.citation.publicationNameProc. 39th IEEE Annual Simulation Symp.
local.citation.startingPage107
local.citation.endingPage116


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Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain