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dc.contributor.authorCarrasco, Juan A.
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2013-07-12T10:11:41Z
dc.date.available2013-07-12T10:11:41Z
dc.date.created2002-03
dc.date.issued2002-03
dc.identifier.citationCarrasco, J. Computationally efficient and numerically stable reliability bounds for repairable fault-tolerant systems. "IEEE transactions on computers", Març 2002, vol. 51, núm. 3, p. 254-268.
dc.identifier.issn0018-9340
dc.identifier.urihttp://hdl.handle.net/2117/19941
dc.description.abstractThe transient analysis of large continuous time Markov reliability models of repairable fault-tolerant systems is computationally expensive due to model stiffness. In this paper, we develop and analyze a method to compute bounds for a measure defined on a particular, but quite wide, class of continuous time Markov models, encompassing both exact and bounding continuous time Markov unreliability models of fault-tolerant systems. The method is numerically stable and computes the bounds with well-controlled and specifiable-in-advance error. Computational effort can be traded off with bounds accuracy. For a class of continuous time Markov models, class C’’, including typical failure/repair reliability models with exponential failure and repair time distributions and repair in every state with failed components, the method can yield reasonably tight bounds ay a very small computational cost. The method builds upon a recently proposed method for the transient analysis of continuous-time Markov models called regenerative randomization.
dc.format.extent15 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Matemàtiques i estadística::Estadística matemàtica
dc.subject.lcshFault-tolerant computing
dc.titleComputationally efficient and numerically stable reliability bounds for repairable fault-tolerant systems
dc.typeArticle
dc.subject.lemacTolerància als errors (Informàtica)
dc.contributor.groupUniversitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.rights.accessOpen Access
local.identifier.drac672959
dc.description.versionPostprint (published version)
local.citation.authorCarrasco, J.
local.citation.publicationNameIEEE transactions on computers
local.citation.volume51
local.citation.number3
local.citation.startingPage254
local.citation.endingPage268


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