Carbon nanotube FET process variability and noise model for radiofrequency investigations

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Landauer, Gerhard Martin
González Jiménez, José Luis
Document typeConference report
Defense date2012
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessRestricted access - publisher's policy
Attribution-NonCommercial-NoDerivs 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain
Abstract
CitationLandauer, G.M.; Gonzalez, J. Carbon nanotube FET process variability and noise model for radiofrequency investigations. A: IEEE International Conference on Nanotechnology. "2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO 2012)". Birmingham: Institute of Electrical and Electronics Engineers (IEEE), 2012, p. 1-5. 
URIhttp://hdl.handle.net/2117/19701
ISBN978-1-4673-2198-3
Publisher versionhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6321963
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