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Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors

dc.contributor.authorBheesayagari, Chenna Reddy
dc.contributor.authorPons Nin, Joan
dc.contributor.authorOrpella García, Alberto
dc.contributor.authorVéliz Noboa, Bremnen Marino
dc.contributor.authorBermejo Broto, Sandra
dc.contributor.authorDomínguez Pumar, Manuel
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor.otherUniversitat Politècnica de Catalunya. Doctorat en Enginyeria Electrònica
dc.date.accessioned2020-06-26T15:03:48Z
dc.date.available2022-04-18T00:27:14Z
dc.date.issued2020-06-20
dc.identifier.citationBheesayagari, C. [et al.]. Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors. "(0013-4686) Electrochimica acta", 20 Juny 2020, vol. 346, p. 136202:1-136202:9.
dc.identifier.urihttp://hdl.handle.net/2117/191726
dc.description© <2020>. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.description.abstractThe objective of this paper is to present a charge trapping control method for MIM capacitors in whichthe dielectric is made of electrospray-deposited silica nanoparticles. The influence of the bias voltage onthe impedance spectra of the devices is analyzed, as well as the main conduction mechanisms along thestructure. The control method allows to monitor and control the long term drifts in the impedance ofthese devices, which are a result of the applied bias voltages.
dc.description.sponsorshipThis work was supported by the Spanish Ministry MINECO un-der project RTI2018-098728-B-C33, by the European Space Agencyunder project ESA AO/1e8876/17/NL/CRS and by SENESCYT of therepublic of Ecuador under agreement 2016-AR5G8871
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria química::Química física::Electroquímica
dc.subject.lcshElectrochemistry
dc.subject.otherMIM capacitors
dc.subject.otherSilica nanospheres
dc.subject.otherCharge control
dc.subject.otherElectrospray
dc.subject.otherSigma-delta control
dc.titleCondution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors
dc.typeArticle
dc.subject.lemacElectroquímica
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.identifier.doi10.1016/j.electacta.2020.136202
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://www.sciencedirect.com/science/article/pii/S0013468620305946
dc.rights.accessOpen Access
local.identifier.drac28371272
dc.description.versionPostprint (author's final draft)
dc.relation.projectidinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/RTI2018-098728-B-C33/ES/INSTRUMENTACION PARA CARACTERIZAR EL ENTORNO MARCIANO EN MISIONES DE LA NASA: SENSORES DE VIENTO PARA MEDA (CONCLUSION DE LAS FASES D Y E)/
local.citation.authorBheesayagari, C.; Pons, J.; Orpella, A.; Véliz, B.; Bermejo, S.; Dominguez, M.
local.citation.publicationName(0013-4686) Electrochimica acta
local.citation.volume346
local.citation.startingPage136202:1
local.citation.endingPage136202:9


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