Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors
Rights accessOpen Access
ProjectINSTRUMENTACION PARA CARACTERIZAR EL ENTORNO MARCIANO EN MISIONES DE LA NASA: SENSORES DE VIENTO PARA MEDA (CONCLUSION DE LAS FASES D Y E) (AEI-RTI2018-098728-B-C33)
The objective of this paper is to present a charge trapping control method for MIM capacitors in whichthe dielectric is made of electrospray-deposited silica nanoparticles. The influence of the bias voltage onthe impedance spectra of the devices is analyzed, as well as the main conduction mechanisms along thestructure. The control method allows to monitor and control the long term drifts in the impedance ofthese devices, which are a result of the applied bias voltages.
© <2020>. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
CitationBheesayagari, C. [et al.]. Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors. "(0013-4686) Electrochimica acta", 20 Juny 2020, vol. 346, p. 136202:1-136202:9.