Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors
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hdl:2117/191726
Document typeArticle
Defense date2020-06-20
Rights accessRestricted access - publisher's policy
(embargoed until 2022-04-18)
Abstract
The objective of this paper is to present a charge trapping control method for MIM capacitors in whichthe dielectric is made of electrospray-deposited silica nanoparticles. The influence of the bias voltage onthe impedance spectra of the devices is analyzed, as well as the main conduction mechanisms along thestructure. The control method allows to monitor and control the long term drifts in the impedance ofthese devices, which are a result of the applied bias voltages.
Description
© <2020>. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
CitationBheesayagari, C. [et al.]. Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors. "(0013-4686) Electrochimica acta", 20 Juny 2020, vol. 346, p. 136202:1-136202:9.
Publisher versionhttps://www.sciencedirect.com/science/article/pii/S0013468620305946
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