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Fault-tolerance capacity of the multilevel active clamped topology
| dc.contributor.author | Nicolás Apruzzese, Joan |
| dc.contributor.author | Busquets Monge, Sergio |
| dc.contributor.author | Bordonau Farrerons, José |
| dc.contributor.author | Alepuz Menéndez, Salvador |
| dc.contributor.author | Calle Prado, Alejandro |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.contributor.other | Escola Tècnica Superior d'Enginyeria Industrial de Barcelona |
| dc.date.accessioned | 2013-05-10T13:04:20Z |
| dc.date.created | 2011 |
| dc.date.issued | 2011 |
| dc.identifier.citation | Nicolas, J. [et al.]. Fault-tolerance capacity of the multilevel active clamped topology. A: IEEE Energy Conversion Congress and Exposition. "IEEE ECCE 2011 proceedings: IEEE Energy Conversion Congress and Exposition: September 17-22, 2011, Hyatt Regency Phoenix, Arizona". Phoenix, AR: IEEE, 2011, p. 3411-3418. |
| dc.identifier.isbn | 978-1-4577-0541-0/11 |
| dc.identifier.uri | http://hdl.handle.net/2117/19159 |
| dc.description.abstract | Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered and the analysis is carried out under single-device and two-simultaneous-device faults. Switching strategies to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis. |
| dc.format.extent | 8 p. |
| dc.language.iso | eng |
| dc.publisher | IEEE |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject.lcsh | Electrical engineering. |
| dc.subject.other | CONVERTER |
| dc.title | Fault-tolerance capacity of the multilevel active clamped topology |
| dc.type | Conference report |
| dc.subject.lemac | Enginyeria elèctrica |
| dc.contributor.group | Universitat Politècnica de Catalunya. GREP - Grup de Recerca en Electrònica de Potència |
| dc.identifier.doi | 10.1109/ECCE.2011.6064230 |
| dc.relation.publisherversion | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6064230&tag=1 |
| dc.rights.access | Restricted access - publisher's policy |
| local.identifier.drac | 10218361 |
| dc.description.version | Postprint (published version) |
| dc.date.lift | 10000-01-01 |
| local.citation.author | Nicolas, J.; Busquets-Monge, S.; Bordonau, J.; Alepuz, S.; Calle, A. |
| local.citation.contributor | IEEE Energy Conversion Congress and Exposition |
| local.citation.pubplace | Phoenix, AR |
| local.citation.publicationName | IEEE ECCE 2011 proceedings: IEEE Energy Conversion Congress and Exposition: September 17-22, 2011, Hyatt Regency Phoenix, Arizona |
| local.citation.startingPage | 3411 |
| local.citation.endingPage | 3418 |