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Efficient and accurate electromagnetic scattering analysis of perfectly conducting thick plates

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10.1109/APUSNCURSINRSM.2019.8888597
 
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hdl:2117/185625

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Úbeda Farré, EduardMés informacióMés informacióMés informació
Sekulic, Ivan
Rius Casals, Juan ManuelMés informacióMés informacióMés informació
Document typeConference report
Defense date2019
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessRestricted access - publisher's policy
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
ProjectSENSORES GRAVIMETRICOS DE GASES BASADOS EN RESONADORES ELECTRO-ACUSTICOS DE ALN PARA APLICACIONES EN TEMPERATURAS EXTREMAS (AEI-TEC2017-84817-C2-2-R)
Abstract
The scattering analysis with the Electric-Field Integral Equation by the Method of Moments of perfectly conducting plates is normally carried out through the thin-plate approximation, which models the closed surface as an open surface and discards the influence of the plate rim. The resulting accuracy is accepted in many practical applications as long as the thickness of the plate is small enough. However, in the scattering analysis of plates with grazing incidences, the thin-plate approximation gives rise to severe inaccuracies. In this paper, we present a new numerical approach, which we name thick-plate formulation, for the accurate computation of the current and the RCS for a plate with nonzero thickness. Our scheme provides similar accuracy as the solution obtained with the full modelling of the plate and with less computational time.
CitationUbeda, E.; Sekulic, I.; Rius, J. Efficient and accurate electromagnetic scattering analysis of perfectly conducting thick plates. A: IEEE International Symposium on Antennas and Propagation. "2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting". Institute of Electrical and Electronics Engineers (IEEE), 2019, p. 1451-1452. 
URIhttp://hdl.handle.net/2117/185625
DOI10.1109/APUSNCURSINRSM.2019.8888597
ISBN978-1-7281-0692-2
Publisher versionhttps://ieeexplore.ieee.org/document/8888597
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