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dc.contributor.authorFernández García, Raúl
dc.contributor.authorGil Galí, Ignacio
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2013-03-18T15:04:11Z
dc.date.available2013-03-18T15:04:11Z
dc.date.created2013
dc.date.issued2013
dc.identifier.citationFernandez, R.; Gil, I. An alternative method to quantify the electromagnetic immunity based on the Weibull distribution. "IEICE electronics express", 2013, vol. 10, núm. 5, p. 1-5.
dc.identifier.issn1349-2543
dc.identifier.urihttp://hdl.handle.net/2117/18372
dc.description.abstractIt is accepted that the electromagnetic interference should be addressed with statistical analysis. Usually the impact of electromagnetic interference on different electronic samples is evaluated and the average immunity level is used as a reference. However, this method does not provide enough information to know the probability of failure to the electromagnetic interferences of an electronic circuit. An alternative statistical analysis based on the Weibull distribution is presented. The typical and proposed methods have been compared in order to analyse the electromagnetic immunity performance of two types of operational amplifier. The results confirm the feasibility of the proposed method.
dc.format.extent5 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Física::Electromagnetisme
dc.subject.lcshWeibull distribution
dc.subject.lcshElectromagnetism
dc.subject.lcshOperational amplifiers
dc.subject.lcshPower amplifiers
dc.titleAn alternative method to quantify the electromagnetic immunity based on the Weibull distribution
dc.typeArticle
dc.subject.lemacElectromagnetisme
dc.subject.lemacAmplificadors de potència
dc.subject.lemacElectromagnetisme
dc.contributor.groupUniversitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group
dc.identifier.doi10.1587/elex.10.20120864
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://www.jstage.jst.go.jp/article/elex/10/5/10_10.20120864/_pdf
dc.rights.accessOpen Access
drac.iddocument11722997
dc.description.versionPostprint (published version)
upcommons.citation.authorFernandez, R.; Gil, I.
upcommons.citation.publishedtrue
upcommons.citation.publicationNameIEICE electronics express
upcommons.citation.volume10
upcommons.citation.number5
upcommons.citation.startingPage1
upcommons.citation.endingPage5


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