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Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Sanahuja Moliner, Ricard |
dc.contributor.author | Balado Suárez, Luz María |
dc.contributor.author | Figueras Pàmies, Joan |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
dc.date.accessioned | 2013-02-22T14:42:57Z |
dc.date.available | 2013-02-22T14:42:57Z |
dc.date.created | 2012 |
dc.date.issued | 2012 |
dc.identifier.citation | Álvaro Gómez-Pau [et al.]. Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.. A: Design of Circuits and Integrated Systems Conference. "Proceedings of XXVIIth Conference on Design of Circuits and Integrated Systems". Avignon: 2012, p. 223-228. |
dc.identifier.isbn | 978-2-9517461-1-4 |
dc.identifier.uri | http://hdl.handle.net/2117/17947 |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Accelerometers. |
dc.title | Built-In test of MEMS capacitive accelerometers for field failures and aging degradation. |
dc.type | Conference report |
dc.subject.lemac | Acceleròmetres |
dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.rights.access | Open Access |
local.identifier.drac | 11420190 |
dc.description.version | Postprint (published version) |
local.citation.author | Álvaro Gómez-Pau; Sanahuja, R.; Balado, L.; Figueras, J. |
local.citation.contributor | Design of Circuits and Integrated Systems Conference |
local.citation.pubplace | Avignon |
local.citation.publicationName | Proceedings of XXVIIth Conference on Design of Circuits and Integrated Systems |
local.citation.startingPage | 223 |
local.citation.endingPage | 228 |